VLSI Test Symposium (VTS 2004) - Ieee - Books - IEEE Computer Society Press,U.S. - 9780769521343 - 2004
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VLSI Test Symposium (VTS 2004)

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The proceedings of the 21st IEEE VLSI test symposium (VTS (2003) describing innovations in the testing of integrated circuits and systems.

Media Books     Paperback Book   (Book with soft cover and glued back)
Released 2004
ISBN13 9780769521343
Publishers IEEE Computer Society Press,U.S.
Pages 550
Dimensions 150 × 220 × 10 mm   ·   911 g   (Weight (estimated))
Language English  

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