Reliability and Failure of Electronic Materials and Devices - Ohring, Milton (Stevens Institute of Technology, Hoboken, NJ, USA (Retired)) - Books - Elsevier Science Publishing Co Inc - 9780120885749 - December 1, 2014
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Ohring, Milton (Stevens Institute of Technology, Hoboken, NJ, USA (Retired))
Reliability and Failure of Electronic Materials and Devices 2nd edition

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Offers coverage of some of the major topics related to the performance and failure of materials used in electronic devices and electronics packaging. This book explains the common mechanisms that lead to electronics materials failures, including dielectric breakdown, hot-electron effects and radiation damage.

758 pages, colour illustrations

Media Books     Hardcover Book   (Book with hard spine and cover)
Released December 1, 2014
ISBN13 9780120885749
Publishers Elsevier Science Publishing Co Inc
Pages 758
Dimensions 165 × 232 × 46 mm   ·   1.17 kg
Language English  

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