Principles of Electron Optics, Volume 3: Fundamental Wave Optics - Hawkes, Peter W. (Founder-President of the European Microscopy Society and Fellow, Microscopy and Optical Societies of America; member of the editorial boards of several microscopy journals and Serial Editor, Advances in Electron Optics, France) - Books - Elsevier Science Publishing Co Inc - 9780128189795 - February 18, 2022
In case cover and title do not match, the title is correct

Hawkes, Peter W. (Founder-President of the European Microscopy Society and Fellow, Microscopy and Optical Societies of America; member of the editorial boards of several microscopy journals and Serial Editor, Advances in Electron Optics, France)
Principles of Electron Optics, Volume 3: Fundamental Wave Optics 2nd edition

Price
Íkr 35,979
excl. VAT

Ordered from remote warehouse

Expected delivery Sep 10 - 24
Get notified about new Hawkes, Peter W. (Founder-President of the European Microscopy Society and Fellow, Microscopy and Optical Societies of America; member of the editorial boards of several microscopy journals and Serial Editor, Advances in Electron Optics, France) releases

Our customers say:

14-day return policy in accordance with European consumer protection law
Top ranking on Trustpilot
Add to your iMusic wish list

Not rated yet

850 pages, Approx. 150 illustrations; Illustrations, unspecified

Media Books     Paperback Book   (Book with soft cover and glued back)
Released February 18, 2022
ISBN13 9780128189795
Publishers Elsevier Science Publishing Co Inc
Pages 558
Dimensions 239 × 195 × 32 mm   ·   952 g

More by Hawkes, Peter W. (Founder-President of the European Microscopy Society and Fellow, Microscopy and Optical Societies of America; member of the editorial boards of several microscopy journals and Serial Editor, Advances in Electron Optics, France)

Show all

More from the same publisher

See all of Hawkes, Peter W. (Founder-President of the European Microscopy Society and Fellow, Microscopy and Optical Societies of America; member of the editorial boards of several microscopy journals and Serial Editor, Advances in Electron Optics, France)