Monte Carlo Modeling for Electron Microscopy and Microanalysis - Oxford Series in Optical and Imaging Sciences - Joy, David C. (Director, Electron Microscope Facility, Director, Electron Microscope Facility, University of Tennessee) - Books - Oxford University Press Inc - 9780195088748 - April 13, 1995
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Joy, David C. (Director, Electron Microscope Facility, Director, Electron Microscope Facility, University of Tennessee)
Monte Carlo Modeling for Electron Microscopy and Microanalysis - Oxford Series in Optical and Imaging Sciences

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This book is a practical guide to the use of Monte Carlo simulation techniques for the study of electron solid interactions in the electron microscope. Programs, optimized for use on personal computers, are developed to deal with typical applications including secondary, and back- scattered, electron imaging. EBIC imaging of semiconductors and X-ray microanalysis.

224 pages, line figures, tables

Media Books     Hardcover Book   (Book with hard spine and cover)
Released April 13, 1995
ISBN13 9780195088748
Publishers Oxford University Press Inc
Pages 224
Dimensions 234 × 156 × 14 mm   ·   498 g
Language English  

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