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Principles of Analytical Electron Microscopy Goldstein Joseph 1986 edition
Principles of Analytical Electron Microscopy
Goldstein Joseph
All currently important areas in analytical electron microscopy-including electron optics, electron beam/specimen interactions, image formation, x-ray microanalysis, energy-loss spectroscopy, electron diffraction and specimen effects-have been given thorough attention.
448 pages, biography
| Media | Books Hardcover Book (Book with hard spine and cover) |
| Released | July 31, 1986 |
| ISBN13 | 9780306423871 |
| Publishers | Springer Science+Business Media |
| Pages | 448 |
| Dimensions | 156 × 234 × 26 mm · 830 g |
| Language | English |
| Editor | Goldstein, Joseph |
| Editor | Joy, David C. |
| Editor | Romig Jr., Alton D. |