Principles of Analytical Electron Microscopy - Goldstein Joseph - Books - Springer Science+Business Media - 9780306423871 - July 31, 1986
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Principles of Analytical Electron Microscopy 1986 edition

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All currently important areas in analytical electron microscopy-including electron optics, electron beam/specimen interactions, image formation, x-ray microanalysis, energy-loss spectroscopy, electron diffraction and specimen effects-have been given thorough attention.


448 pages, biography

Media Books     Hardcover Book   (Book with hard spine and cover)
Released July 31, 1986
ISBN13 9780306423871
Publishers Springer Science+Business Media
Pages 448
Dimensions 156 × 234 × 26 mm   ·   830 g
Language English  
Editor Goldstein, Joseph
Editor Joy, David C.
Editor Romig Jr., Alton D.

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