Scanning Transmission Electron Microscopy: Advanced Characterization Methods for Materials Science Applications - - Books - Taylor & Francis Ltd - 9780367197360 - December 21, 2020
In case cover and title do not match, the title is correct

Scanning Transmission Electron Microscopy: Advanced Characterization Methods for Materials Science Applications 1st edition

Price
Íkr 22,199
excl. VAT

Ordered from remote warehouse

Expected delivery Jun 1 - 15

Our customers say:

14-day return policy in accordance with European consumer protection law
Top ranking on Trustpilot
Add to your iMusic wish list

Also available as:

This book focuses on explaining and applying the principles of machine learning-based techniques and advanced image processing methods currently used in the electron microscopy community suitable for handling large electron microscopy data sets and extracting structure-property information for various materials.

184 pages, 7 Tables, black and white; 25 Illustrations, color; 81 Illustrations, black and white

Media Books     Hardcover Book   (Book with hard spine and cover)
Released December 21, 2020
ISBN13 9780367197360
Publishers Taylor & Francis Ltd
Pages 150
Dimensions 241 × 159 × 17 mm   ·   406 g
Language English  
Editor Bruma, Alina (University of Maryland College Park)

Mere med samme udgiver