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ESD: Failure Mechanisms and Models Voldman, Steven H. (IEEE Fellow, Vermont, USA)
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ESD: Failure Mechanisms and Models
Voldman, Steven H. (IEEE Fellow, Vermont, USA)
Provides a comprehensive analysis of ESD failure mechanisms over a wide range of semiconductor materials, devices, circuits and applications. Sets out methods for eliminating failure mechanisms through workable circuit solutions, including practical examples of failure defects.
408 pages, Illustrations
| Media | Books Hardcover Book (Book with hard spine and cover) |
| Released | July 17, 2009 |
| ISBN13 | 9780470511374 |
| Publishers | John Wiley & Sons Inc |
| Pages | 408 |
| Dimensions | 253 × 176 × 29 mm · 820 g |
| Language | English |
