Electromigration and Electronic Device Degradation - A Christou - Books - John Wiley & Sons Inc - 9780471584896 - January 14, 1994
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A Christou
Electromigration and Electronic Device Degradation

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This study reviews an important reliability issue for both silicon and GaAs technologies. It surveys the status of electromigration physics in microelectronics, and summarizes various rate controlling details.

344 pages

Media Books     Hardcover Book   (Book with hard spine and cover)
Released January 14, 1994
ISBN13 9780471584896
Publishers John Wiley & Sons Inc
Pages 343
Dimensions 160 × 240 × 20 mm   ·   684 g
Language English  
Editor Christou, Aris (CALCE Electronic Packaging Research Center, University of Maryland)

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