Failure Mechanisms in Semiconductor Devices - Amerasekera, E. Ajith (Texas Instruments Inc.) - Books - John Wiley & Sons Inc - 9780471954828 - August 4, 1997
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Amerasekera, E. Ajith (Texas Instruments Inc.)
Failure Mechanisms in Semiconductor Devices 2nd edition

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In this second edition, the authors identify the sources of failure mechanism in semiconductor devices, examine possible detection and elimination techniques, and determine the effectiveness of reliability devices. The references have been updated and recent advances are discussed.

358 pages, Illustrations

Media Books     Hardcover Book   (Book with hard spine and cover)
Released August 4, 1997
ISBN13 9780471954828
Publishers John Wiley & Sons Inc
Pages 360
Dimensions 156 × 233 × 25 mm   ·   616 g
Language English  

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