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Noise in Bipolar Junction Transistors at Cryogenic Temperatures. Thomas Wade
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Noise in Bipolar Junction Transistors at Cryogenic Temperatures.
Thomas Wade
| Media | Books Hardcover Book (Book with hard spine and cover) |
| Released | December 8, 2019 |
| ISBN13 | 9780530019499 |
| Publishers | Dissertation Discovery Company |
| Pages | 258 |
| Dimensions | 150 × 220 × 20 mm · 889 g |
| Language | English |
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