Residual Stress Measurement by X-Ray Diffraction - SAE International - Books - SAE International - 9780768010695 - February 28, 2003
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SAE International
Residual Stress Measurement by X-Ray Diffraction

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This editorial review of J784a is based upon decades of experience in the practical application of x-ray diffraction residual stress measurement methods in thousands of individual applications. J784 is a classic document. It serves as the only recognized standard for residual stress measurement available.

96 pages

Media Books     Paperback Book   (Book with soft cover and glued back)
Released February 28, 2003
ISBN13 9780768010695
Publishers SAE International
Pages 96
Dimensions 150 × 220 × 10 mm   ·   197 g   (Weight (estimated))

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