2000 European Test Workshop (Etw) IEEE Postproceed - Ieee - Books - IEEE Computer Society Press,U.S. - 9780769507019 - November 1, 2000
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2000 European Test Workshop (Etw) IEEE Postproceed

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The 25 papers cover delay testing and test scheduling, scan and functional testing, system testing, quiescent current testing, analog and mixed-signal testing, core-based testing, fault simulation and field programmable gate array testing, challenges in deep sub-micron testing, high level tests, mem

Media Books     Paperback Book   (Book with soft cover and glued back)
Released November 1, 2000
ISBN13 9780769507019
Publishers IEEE Computer Society Press,U.S.
Pages 181
Dimensions 216 × 273 × 13 mm   ·   650 g   (Weight (estimated))
Language English  

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