Design for AT-Speed Test, Diagnosis and Measurement - Frontiers in Electronic Testing - Benoit Nadeau-dostie - Books - Springer - 9780792386698 - September 30, 1999
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Benoit Nadeau-dostie
Design for AT-Speed Test, Diagnosis and Measurement - Frontiers in Electronic Testing 2000 edition

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Design for AT-Speed Test, Diagnosis and Measurement is the first book to offer practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as at the board and systems levels.

239 pages, biography

Media Books     Hardcover Book   (Book with hard spine and cover)
Released September 30, 1999
ISBN13 9780792386698
Publishers Springer
Pages 239
Dimensions 178 × 254 × 15 mm   ·   653 g
Language English  
Editor Nadeau-Dostie, Benoit

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