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Assessing Fault Model and Test Quality - The Springer International Series in Engineering and Computer Science Kenneth M. Butler 1992 edition
Assessing Fault Model and Test Quality - The Springer International Series in Engineering and Computer Science
Kenneth M. Butler
For many years, the dominant fault model in automatic test pattern gen eration (ATPG) for digital integrated circuits has been the stuck-at fault model.
132 pages, biography
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