Hot-Carrier Reliability of MOS VLSI Circuits - The Springer International Series in Engineering and Computer Science - Yusuf Leblebici - Books - Springer - 9780792393528 - June 30, 1993
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Yusuf Leblebici
Hot-Carrier Reliability of MOS VLSI Circuits - The Springer International Series in Engineering and Computer Science 1993 edition

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The development and use of accurate reliability simulation tools are therefore crucial for early assessment and improvement of circuit reliability : Once the long-term reliability of the circuit is estimated through simulation, the results can be compared with predetermined reliability specifications or limits.

229 pages, biography

Media Books     Hardcover Book   (Book with hard spine and cover)
Released June 30, 1993
ISBN13 9780792393528
Publishers Springer
Pages 212
Dimensions 155 × 235 × 14 mm   ·   508 g
Language English  

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