In case cover and title do not match, the title is correct

Tell your friends about this item:

Singh
Metrology, Inspection, and Process Control for Microlithography: XIII (Proceedings of SPIE) Singh

Do you have a profile? Log in

Get notified about new Singh releases

Our customers say:

Add to your iMusic wish list

Not rated yet

Metrology, Inspection, and Process Control for Microlithography: XIII (Proceedings of SPIE)

1052 pages, illustrations

Media	Books Paperback Book (Book with soft cover and glued back)
Released	June 30, 1999
ISBN13	9780819431516
Publishers	SPIE Press
Pages	1052
Dimensions	150 × 220 × 10 mm · 1.74 kg (Weight (estimated))

Show all