Speckle Metrology - Optical Science and Engineering - Sirohi - Books - Taylor & Francis Inc - 9780824789329 - May 20, 1993
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Sirohi
Speckle Metrology - Optical Science and Engineering 1st edition

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Covers speckle metrology and its value as a measuring technique in industry. This book also surveys the origin of speckle displacement and decorrelation, presents procedures for deformation analysis and shape measurement of rough objects, and explains particle image velocimetry (PIV).

568 pages

Media Books     Hardcover Book   (Book with hard spine and cover)
Released May 20, 1993
ISBN13 9780824789329
Publishers Taylor & Francis Inc
Pages 572
Dimensions 150 × 220 × 20 mm   ·   861 g
Language English  
Series Editor Thompson, Brian J. (University of Rochester, New York, USA)

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