Yield Simulation for Integrated Circuits - The Springer International Series in Engineering and Computer Science - D.M. Walker - Books - Kluwer Academic Publishers - 9780898382440 - September 30, 1987
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D.M. Walker
Yield Simulation for Integrated Circuits - The Springer International Series in Engineering and Computer Science 1987 edition

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Since only half the chip area would have redundancy, I was concerned that the increase in yield would not outweigh the increased costs of testing and redundancy programming. I wanted a simulator that would allow me to evaluate the yield of arbitrary redundant layouts, hence I termed such a simulator a layout or yield simulator.

209 pages, biography

Media Books     Hardcover Book   (Book with hard spine and cover)
Released September 30, 1987
ISBN13 9780898382440
Publishers Kluwer Academic Publishers
Pages 209
Dimensions 156 × 234 × 14 mm   ·   512 g
Language English  

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