CMOS Gate-Stack Scaling — Materials, Interfaces and Reliability Implications: Volume 1155 - MRS Proceedings - - Books - Cambridge University Press - 9781107408326 - June 5, 2014
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CMOS Gate-Stack Scaling — Materials, Interfaces and Reliability Implications: Volume 1155 - MRS Proceedings

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The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.

194 pages, black & white illustrations

Media Books     Paperback Book   (Book with soft cover and glued back)
Released June 5, 2014
ISBN13 9781107408326
Publishers Cambridge University Press
Pages 194
Dimensions 152 × 229 × 10 mm   ·   412 g   (Weight (estimated))
Language English  
Editor Butterbaugh, Jeffery W.
Editor Demkov, Alexander A. (University of Texas, Austin)
Editor Harris, H. Rusty (Texas A & M University)
Editor Rachmady, Willy
Editor Taylor, Bill