Investigation of Gate Current in Neutron Irradiated Alxga1-Xn / Gan Heterogeneous Field Effect Transistors Using Voltage and Temperature Dependence - Thomas E Gray - Books - Biblioscholar - 9781288308347 - November 16, 2012
In case cover and title do not match, the title is correct

Thomas E Gray
Investigation of Gate Current in Neutron Irradiated Alxga1-Xn / Gan Heterogeneous Field Effect Transistors Using Voltage and Temperature Dependence

Price
Íkr 3,189
excl. VAT

Ordered from remote warehouse

Expected delivery Jul 23 - Aug 6
Get notified about new Thomas E Gray releases

Our customers say:

14-day return policy in accordance with European consumer protection law
Top ranking on Trustpilot
Add to your iMusic wish list

Not rated yet

128 pages, Illustrations, black and white

Media Books     Paperback Book   (Book with soft cover and glued back)
Released November 16, 2012
ISBN13 9781288308347
Publishers Biblioscholar
Pages 128
Dimensions 189 × 246 × 7 mm   ·   185 g

More by Thomas E Gray

Show all

See all of Thomas E Gray ( e.g. Paperback Book )