High Performance Memory Testing: Design Principles, Fault Modeling and Self-test - Frontiers in Electronic Testing - R. Dean Adams - Books - Kluwer Academic Publishers - 9781402072550 - September 30, 2002
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R. Dean Adams
High Performance Memory Testing: Design Principles, Fault Modeling and Self-test - Frontiers in Electronic Testing 2002 edition

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Memory applications and the number of designs and the sheer number of bits on each design are critical. Based on the author's experience in memory design, memory reliability development and memory self test, this book is written for professionals and researchers, helping them understand the memories that are tested.

250 pages, biography

Media Books     Hardcover Book   (Book with hard spine and cover)
Released September 30, 2002
ISBN13 9781402072550
Publishers Kluwer Academic Publishers
Pages 250
Dimensions 156 × 234 × 15 mm   ·   562 g
Language English  

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