An Artificial Intelligence Approach to Test Generation - The Springer International Series in Engineering and Computer Science - Narinder Singh - Books - Springer-Verlag New York Inc. - 9781461291831 - October 5, 2011
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An Artificial Intelligence Approach to Test Generation - The Springer International Series in Engineering and Computer Science Softcover reprint of the original 1st ed. 1987 edition

Narinder Singh

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An Artificial Intelligence Approach to Test Generation - The Springer International Series in Engineering and Computer Science Softcover reprint of the original 1st ed. 1987 edition

I am indebted to my thesis advisor, Michael Genesereth, for his guidance, inspiration, and support which has made this research possible. This research was supported by Schlumberger Palo Alto Research (previously Fairchild Laboratory for Artificial Intelligence).

194 pages, biography

Media Books     Paperback Book   (Book with soft cover and glued back)
Released October 5, 2011
ISBN13 9781461291831
Publishers Springer-Verlag New York Inc.
Pages 194
Dimensions 155 × 235 × 11 mm   ·   303 g
Language English  
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