Software Defect and Operational Profile Modeling - International Series in Software Engineering - Kai-yuan Cai - Books - Springer-Verlag New York Inc. - 9781461375593 - October 12, 2012
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Software Defect and Operational Profile Modeling - International Series in Software Engineering Softcover Reprint of the Original 1st Ed. 1998 edition

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also in: THE KLUWER INTERNATIONAL SERIES ON ASIAN STUDIES IN COMPUTER AND INFORMATION SCIENCE, Volume 1


268 pages, biography

Media Books     Paperback Book   (Book with soft cover and glued back)
Released October 12, 2012
ISBN13 9781461375593
Publishers Springer-Verlag New York Inc.
Pages 268
Dimensions 155 × 235 × 15 mm   ·   412 g
Language English  

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