Materials, Processes and Reliability for Advanced Interconnects for Micro- and Nanoelectronics — 2009: Volume 1156 - MRS Proceedings - M Gall - Books - Materials Research Society - 9781605111292 - November 18, 2009
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M Gall
Materials, Processes and Reliability for Advanced Interconnects for Micro- and Nanoelectronics — 2009: Volume 1156 - MRS Proceedings

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The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.

189 pages, illustrations

Media Books     Hardcover Book   (Book with hard spine and cover)
Released November 18, 2009
ISBN13 9781605111292
Publishers Materials Research Society
Pages 204
Dimensions 160 × 235 × 15 mm   ·   400 g
Language English  
Editor Gall, Martin
Editor Grill, Alfred (IBM T J Watson Research Center, New York)
Editor Koike, Junichi (Tohoku University, Japan)
Editor Lacopi, Francesca
Editor Usui, Takamasa

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