Applications and Metrology at Nanometer Scale 1: Smart Materials, Electromagnetic Waves and Uncertainties - Pierre-Richard Dahoo - Books - ISTE Ltd and John Wiley & Sons Inc - 9781786306401 - March 16, 2021
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Pierre-Richard Dahoo
Applications and Metrology at Nanometer Scale 1: Smart Materials, Electromagnetic Waves and Uncertainties

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256 pages

Media Books     Hardcover Book   (Book with hard spine and cover)
Released March 16, 2021
ISBN13 9781786306401
Publishers ISTE Ltd and John Wiley & Sons Inc
Pages 256
Dimensions 150 × 220 × 20 mm   ·   526 g
Language English  

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