Rf and Microwave Modeling and Measurement Techniques for Field Effect Transistors - Electromagnetics and Radar - Jianjun Gao - Books - SciTech Publishing Inc - 9781891121890 - June 30, 2010
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Jianjun Gao
Rf and Microwave Modeling and Measurement Techniques for Field Effect Transistors - Electromagnetics and Radar

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350 pages, illustrations

Media Books     Hardcover Book   (Book with hard spine and cover)
Released June 30, 2010
ISBN13 9781891121890
Publishers SciTech Publishing Inc
Pages 350
Dimensions 150 × 220 × 20 mm   ·   589 g

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