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Introduction to Quantum Metrology: The Revised SI System and Quantum Standards Waldemar Nawrocki Second Edition 2019 edition
Introduction to Quantum Metrology: The Revised SI System and Quantum Standards
Waldemar Nawrocki
This book discusses the theory of quantum effects used in metrology, and presents the author’s research findings in the field of quantum electronics.
326 pages, 40 Tables, color; 62 Illustrations, color; 90 Illustrations, black and white; XIV, 326 p.
| Media | Books Paperback Book (Book with soft cover and glued back) |
| Released | August 14, 2020 |
| ISBN13 | 9783030196790 |
| Publishers | Springer Nature Switzerland AG |
| Pages | 326 |
| Dimensions | 150 × 220 × 10 mm · 522 g |
| Language | English |
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