Introduction to Quantum Metrology: The Revised SI System and Quantum Standards - Waldemar Nawrocki - Books - Springer Nature Switzerland AG - 9783030196790 - August 14, 2020
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Introduction to Quantum Metrology: The Revised SI System and Quantum Standards Second Edition 2019 edition

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This book discusses the theory of quantum effects used in metrology, and presents the author’s research findings in the field of quantum electronics.


326 pages, 40 Tables, color; 62 Illustrations, color; 90 Illustrations, black and white; XIV, 326 p.

Media Books     Paperback Book   (Book with soft cover and glued back)
Released August 14, 2020
ISBN13 9783030196790
Publishers Springer Nature Switzerland AG
Pages 326
Dimensions 150 × 220 × 10 mm   ·   522 g
Language English  

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