Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM - R.F. Egerton - Books - Springer International Publishing AG - 9783319398761 - July 7, 2016
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Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM 2nd ed. 2016 edition

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Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences.


207 pages, 109 black & white illustrations, 15 colour illustrations, biography

Media Books     Hardcover Book   (Book with hard spine and cover)
Released July 7, 2016
ISBN13 9783319398761
Publishers Springer International Publishing AG
Pages 196
Dimensions 165 × 243 × 22 mm   ·   471 g
Language German  

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