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Quantum Metrology, Imaging, and Communication - Quantum Science and Technology 1st ed. 2017 edition
David S. Simon
Quantum Metrology, Imaging, and Communication - Quantum Science and Technology 1st ed. 2017 edition
David S. Simon
This book describes the experimental and theoretical bases for the development of specifically quantum-mechanical approaches to metrology, imaging, and communication. The particular techniques explored include two-photon interferometry, two-photon optical aberration and dispersion cancellation, lithography, microscopy, and cryptography.
273 pages, 37 black & white illustrations, 68 colour illustrations, 40 colour tables, biography
Media | Books Hardcover Book (Book with hard spine and cover) |
Released | December 8, 2016 |
ISBN13 | 9783319465494 |
Publishers | Springer International Publishing AG |
Pages | 273 |
Dimensions | 242 × 164 × 21 mm · 580 g |
Language | French |
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