Electromigration Inside Logic Cells: Modeling, Analyzing and Mitigating Signal Electromigration in NanoCMOS - Gracieli Posser - Books - Springer International Publishing AG - 9783319488981 - December 16, 2016
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Electromigration Inside Logic Cells: Modeling, Analyzing and Mitigating Signal Electromigration in NanoCMOS 1st ed. 2017 edition

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This book describes new and effective methodologies for modeling, analyzing and mitigating cell-internal signal electromigration in nanoCMOS, with significant circuit lifetime improvements and no impact on performance, area and power.


118 pages, 3 black & white illustrations, 69 colour illustrations, 35 colour tables, biography

Media Books     Hardcover Book   (Book with hard spine and cover)
Released December 16, 2016
ISBN13 9783319488981
Publishers Springer International Publishing AG
Pages 118
Dimensions 155 × 235 × 10 mm   ·   376 g

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