Gettering Defects in Semiconductors - Springer Series in Advanced Microelectronics - Victor A. Perevostchikov - Books - Springer-Verlag Berlin and Heidelberg Gm - 9783642065705 - October 21, 2010
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Victor A. Perevostchikov
Gettering Defects in Semiconductors - Springer Series in Advanced Microelectronics Softcover reprint of hardcover 1st ed. 2005 edition

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Gettering Defects in Semiconductors fulfills three basic purposes:

? to systematize the experience and research in exploiting various gettering techniques in microelectronics and nanoelectronics;

? to identify new directions in research, particularly to enhance the perspective of professionals and young researchers and specialists;

? to fill a gap in the contemporary literature on the underlying semiconductor-material theory.

The authors address not only well-established gettering techniques but also describe contemporary trends in gettering technologies from an international perspective. The types and properties of structural defects in semiconductors, their generating and their transforming mechanisms during fabrication are described. The primary emphasis is placed on classifying and describing specific gettering techniques, their specificity arising from both their position in a general technological process and the regimes of their application. This book addresses both engineers and material scientists interested in semiconducting materials theory and also undergraduate and graduate students in solid?state microelectronics and nanoelectronics. A comprehensive list of references provides readers with direction for further reading.

388 pages, 70 black & white illustrations, biography

Media Books     Paperback Book   (Book with soft cover and glued back)
Released October 21, 2010
ISBN13 9783642065705
Publishers Springer-Verlag Berlin and Heidelberg Gm
Pages 388
Dimensions 155 × 235 × 21 mm   ·   562 g
Language English  
Translator Gloumov, Victor

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