Atomic Force Microscopy Based Nanorobotics: Modelling, Simulation, Setup Building and Experiments - Springer Tracts in Advanced Robotics - Hui Xie - Books - Springer-Verlag Berlin and Heidelberg Gm - 9783642203282 - September 28, 2011
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Hui Xie
Atomic Force Microscopy Based Nanorobotics: Modelling, Simulation, Setup Building and Experiments - Springer Tracts in Advanced Robotics 2011 edition

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The atomic force microscope (AFM) has been successfully used to perform nanorobotic manipulation operations on nanoscale entities such as particles, nanotubes, nanowires, nanocrystals, and DNA since 1990s.

360 pages, biography

Media Books     Hardcover Book   (Book with hard spine and cover)
Released September 28, 2011
ISBN13 9783642203282
Publishers Springer-Verlag Berlin and Heidelberg Gm
Pages 344
Dimensions 155 × 235 × 25 mm   ·   612 g
Language French  

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