Field-Ion Microscopy - Crystals - R. Wagner - Books - Springer-Verlag Berlin and Heidelberg Gm - 9783642686894 - December 7, 2011
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R. Wagner
Field-Ion Microscopy - Crystals Softcover reprint of the original 1st ed. 1982 edition

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Despite the recent progress in developing various microanalytical tools of better spatial resolution and more sensitivity to chemical analyses for the study of various defects in metallic solids the Field-Ion Microscope (FIM) still remains the only instrument up to now to resolve single atoms in the surface of a metal.

134 pages, biography

Media Books     Paperback Book   (Book with soft cover and glued back)
Released December 7, 2011
ISBN13 9783642686894
Publishers Springer-Verlag Berlin and Heidelberg Gm
Pages 118
Dimensions 170 × 244 × 7 mm   ·   226 g
Language German  
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