David Sayre
X-Ray Microscopy II: Proceedings of the International Symposium, Brookhaven, NY, August 31-September 4, 1987 - Springer Series in Optical Sciences David Sayre Softcover reprint of the original 1st ed. 1988 edition

Name: X-Ray Microscopy II: Proceedings of the International Symposium, Brookhaven, NY, August 31-September 4, 1987 - Springer Series in Optical Sciences
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Author: David Sayre

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X-Ray Microscopy II: Proceedings of the International Symposium, Brookhaven, NY, August 31-September 4, 1987 - Springer Series in Optical Sciences

David Sayre

Softcover reprint of the original 1st ed. 1988 edition

This volume is based on papers presented at the International Symposium on X-Ray Microscopy held at Brookhaven National Laboratory, Upton NY, August 31-September 4, 1987.

455 pages, 286 black & white illustrations, 2 colour illustrations, biography

Media	Books Paperback Book (Book with soft cover and glued back)
Released	October 3, 2013
ISBN13	9783662144909
Publishers	Springer-Verlag Berlin and Heidelberg Gm
Pages	455
Dimensions	152 × 229 × 24 mm · 625 g
Language	German
Editor	Howells, Malcolm
Editor	Kirz, Janos
Editor	Rarback, Harvey
Editor	Sayre, David