Semiconductor Device Reliability - Nato Science Series E: - A Christou - Books - Springer - 9789401076203 - October 5, 2011
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A Christou
Semiconductor Device Reliability - Nato Science Series E: Softcover reprint of the original 1st ed. 1990 edition

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Proceedings of the NATO Advanced Research Workshop, Heraklion, Crete, Greece, June 4-9, 1989

575 pages, biography

Media Books     Paperback Book   (Book with soft cover and glued back)
Released October 5, 2011
ISBN13 9789401076203
Publishers Springer
Pages 575
Dimensions 155 × 235 × 30 mm   ·   811 g
Editor Christou, A.
Editor Unger, B.A.

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