Test Generation of Crosstalk Delay Faults in VLSI Circuits - Jayanthy - Books - Springer Verlag, Singapore - 9789811324925 - October 10, 2018
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Jayanthy
Test Generation of Crosstalk Delay Faults in VLSI Circuits 1st ed. 2019 edition

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The book begins with a focus on currently available crosstalk delay models, test generation algorithms for delay faults and crosstalk delay faults, before moving on to deterministic algorithms and simulation-based algorithms used to test crosstalk delay faults.

156 pages, 30 Tables, color; 7 Illustrations, color; 42 Illustrations, black and white; XI, 156 p. 4

Media Books     Book
Released October 10, 2018
ISBN13 9789811324925
Publishers Springer Verlag, Singapore
Pages 156
Dimensions 150 × 220 × 20 mm   ·   417 g

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