Advanced Scanning Electron Microscopy and X-Ray Microanalysis - Patrick Echlin - Books - Springer Science+Business Media - 9780306421402 - March 31, 1986
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Patrick Echlin
Advanced Scanning Electron Microscopy and X-Ray Microanalysis 1986 edition

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This book has its origins in the intensive short courses on scanning elec tron microscopy and x-ray microanalysis which have been taught annually at Lehigh University since 1972.

454 pages, biography

Media Books     Hardcover Book   (Book with hard spine and cover)
Released March 31, 1986
ISBN13 9780306421402
Publishers Springer Science+Business Media
Pages 454
Dimensions 156 × 234 × 27 mm   ·   721 g
Language English  

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