Advanced Scanning Electron Microscopy and X-Ray Microanalysis - Patrick Echlin - Books - Springer-Verlag New York Inc. - 9781475790290 - June 8, 2013
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Advanced Scanning Electron Microscopy and X-Ray Microanalysis Softcover reprint of the original 1st ed. 1986 edition

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This book has its origins in the intensive short courses on scanning elec tron microscopy and x-ray microanalysis which have been taught annually at Lehigh University since 1972.


466 pages, 357 black & white illustrations, 7 colour illustrations, biography

Media Books     Paperback Book   (Book with soft cover and glued back)
Released June 8, 2013
ISBN13 9781475790290
Publishers Springer-Verlag New York Inc.
Pages 454
Dimensions 152 × 229 × 24 mm   ·   630 g
Language English  

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