Power-Constrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Standard - Frontiers in Electronic Testing - Nicola Nicolici - Books - Springer-Verlag New York Inc. - 9781402072352 - February 28, 2003
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Nicola Nicolici
Power-Constrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Standard - Frontiers in Electronic Testing 2003 edition

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This text focuses on techniques for minimizing power dissipation during test application at logic and register-transfer levels of abstraction of the VLSI design flow. It surveys existing techniques and presents several test automation techniques for reducing power in scan-based sequential circuits and BIST data paths.

178 pages, biography

Media Books     Hardcover Book   (Book with hard spine and cover)
Released February 28, 2003
ISBN13 9781402072352
Publishers Springer-Verlag New York Inc.
Pages 178
Dimensions 210 × 297 × 12 mm   ·   476 g
Language English  

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