Image-Based Fractal Description of Microstructures - J.M. Li - Books - Springer-Verlag New York Inc. - 9781402075070 - July 31, 2003
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J.M. Li
Image-Based Fractal Description of Microstructures 2003 edition

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Fractal analysis has rapidly become an important field in materials science and engineering with broad applications to theoretical analysis and quantitative description of microstructures of materials. Fractal measurement, error analysis and fractal description of cluster growth, thin films and surfaces are emphasized in this book.

272 pages, biography

Media Books     Hardcover Book   (Book with hard spine and cover)
Released July 31, 2003
ISBN13 9781402075070
Publishers Springer-Verlag New York Inc.
Pages 272
Dimensions 155 × 235 × 17 mm   ·   616 g
Language English  

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