A Designer's Guide to Built-In Self-Test - Frontiers in Electronic Testing - Charles E. Stroud - Books - Springer-Verlag New York Inc. - 9781475776263 - March 18, 2013
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Charles E. Stroud
A Designer's Guide to Built-In Self-Test - Frontiers in Electronic Testing Softcover reprint of the original 1st ed. 2002 edition

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A recent technological advance is the art of designing circuits to test themselves, referred to as a Built-In Self-Test. This book is written from a designer's perspective and describes the major BIST approaches that have been proposed and implemented, along with their advantages and limitations.

340 pages, biography

Media Books     Paperback Book   (Book with soft cover and glued back)
Released March 18, 2013
ISBN13 9781475776263
Publishers Springer-Verlag New York Inc.
Pages 320
Dimensions 155 × 235 × 18 mm   ·   480 g
Language English  

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