Metal Impurities in Silicon- and Germanium-Based Technologies: Origin, Characterization, Control, and Device Impact - Springer Series in Materials Science - Cor Claeys - Books - Springer Nature Switzerland AG - 9783030067472 - January 30, 2019
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Metal Impurities in Silicon- and Germanium-Based Technologies: Origin, Characterization, Control, and Device Impact - Springer Series in Materials Science Softcover reprint of the original 1st ed. 2018 edition

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material science, defect engineering, device processing, defect and device characterization, and device physics and engineering.


438 pages, 207 Illustrations, color; 8 Illustrations, black and white; XXXIII, 438 p. 215 illus., 20

Media Books     Paperback Book   (Book with soft cover and glued back)
Released January 30, 2019
ISBN13 9783030067472
Publishers Springer Nature Switzerland AG
Pages 438
Dimensions 150 × 220 × 10 mm   ·   657 g
Language German  

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