Metal Impurities in Silicon- and Germanium-Based Technologies: Origin, Characterization, Control, and Device Impact - Springer Series in Materials Science - Cor Claeys - Books - Springer International Publishing AG - 9783319939247 - August 22, 2018
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Metal Impurities in Silicon- and Germanium-Based Technologies: Origin, Characterization, Control, and Device Impact - Springer Series in Materials Science 1st ed. 2018 edition

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material science, defect engineering, device processing, defect and device characterization, and device physics and engineering.


438 pages, 207 Illustrations, color; 8 Illustrations, black and white; XXXIII, 438 p. 215 illus., 20

Media Books     Hardcover Book   (Book with hard spine and cover)
Released August 22, 2018
ISBN13 9783319939247
Publishers Springer International Publishing AG
Pages 438
Dimensions 150 × 220 × 20 mm   ·   834 g
Language French  

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