Kelvin Probe Force Microscopy: From Single Charge Detection to Device Characterization - Springer Series in Surface Sciences - - Books - Springer Nature Switzerland AG - 9783030092986 - January 4, 2019
In case cover and title do not match, the title is correct

Kelvin Probe Force Microscopy: From Single Charge Detection to Device Characterization - Springer Series in Surface Sciences Softcover Reprint of the Original 1st 2018 edition

Price
Íkr 28,509
excl. VAT

Ordered from remote warehouse

Expected delivery Jun 5 - 15

Our customers say:

14-day return policy in accordance with European consumer protection law
Top ranking on Trustpilot
Add to your iMusic wish list

Also available as:

521 pages, 40 Tables, color; 194 Illustrations, color; 40 Illustrations, black and white; XXIV, 521

Media Books     Paperback Book   (Book with soft cover and glued back)
Released January 4, 2019
ISBN13 9783030092986
Publishers Springer Nature Switzerland AG
Pages 521
Dimensions 150 × 220 × 10 mm   ·   757 g
Language German  
Editor Glatzel, Thilo
Editor Sadewasser, Sascha

Mere med samme udgiver