Kelvin Probe Force Microscopy: From Single Charge Detection to Device Characterization - Springer Series in Surface Sciences - - Books - Springer International Publishing AG - 9783319756868 - March 19, 2018
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Kelvin Probe Force Microscopy: From Single Charge Detection to Device Characterization - Springer Series in Surface Sciences 2018 edition

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521 pages, 40 Tables, color; 194 Illustrations, color; 40 Illustrations, black and white; XXIV, 521

Media Books     Hardcover Book   (Book with hard spine and cover)
Released March 19, 2018
ISBN13 9783319756868
Publishers Springer International Publishing AG
Pages 521
Dimensions 242 × 167 × 38 mm   ·   986 g
Language German  
Editor Glatzel, Thilo
Editor Sadewasser, Sascha

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