Infrared Ellipsometry on Semiconductor Layer Structures: Phonons, Plasmons, and Polaritons - Springer Tracts in Modern Physics - Mathias Schubert - Books - Springer-Verlag Berlin and Heidelberg Gm - 9783540232490 - November 26, 2004
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Mathias Schubert
Infrared Ellipsometry on Semiconductor Layer Structures: Phonons, Plasmons, and Polaritons - Springer Tracts in Modern Physics 2004 edition

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The study of semiconductor-layer structures using infrared ellipsometry is a rapidly growing field within optical spectroscopy.

196 pages, biography

Media Books     Hardcover Book   (Book with hard spine and cover)
Released November 26, 2004
ISBN13 9783540232490
Publishers Springer-Verlag Berlin and Heidelberg Gm
Pages 196
Dimensions 155 × 232 × 12 mm   ·   476 g
Language English   German  

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