Mathias Schubert
Infrared Ellipsometry on Semiconductor Layer Structures: Phonons, Plasmons, and Polaritons - Springer Tracts in Modern Physics Mathias Schubert Softcover reprint of hardcover 1st ed. 2004 edition

Name: Infrared Ellipsometry on Semiconductor Layer Structures: Phonons, Plasmons, and Polaritons - Springer Tracts in Modern Physics
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Author: Mathias Schubert

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Hardcover Book

2004 edition

(2004) Íkr 33,359

Infrared Ellipsometry on Semiconductor Layer Structures: Phonons, Plasmons, and Polaritons - Springer Tracts in Modern Physics

Mathias Schubert

Softcover reprint of hardcover 1st ed. 2004 edition

The study of semiconductor-layer structures using infrared ellipsometry is a rapidly growing field within optical spectroscopy.

196 pages, biography

Media	Books Paperback Book (Book with soft cover and glued back)
Released	November 23, 2010
ISBN13	9783642062285
Publishers	Springer-Verlag Berlin and Heidelberg Gm
Pages	196
Dimensions	155 × 235 × 11 mm · 299 g
Language	English