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Positron Annihilation in Semiconductors: Defect Studies - Springer Series in Solid-State Sciences Reinhard Krause-Rehberg 1st ed. 1999. Corr. 2nd printing 2003 edition
Positron Annihilation in Semiconductors: Defect Studies - Springer Series in Solid-State Sciences
Reinhard Krause-Rehberg
This comprehensive book reports on recent investigations of lattice imperfections in semiconductors by means of positron annihilation. It reviews positron techniques, and describes the application of these techniques to various kinds of defects, such as vacancies, impurity vacancy complexes and dislocations.
383 pages, 121 black & white illustrations, 20 black & white tables, biography
| Media | Books Hardcover Book (Book with hard spine and cover) |
| Released | January 21, 1999 |
| ISBN13 | 9783540643715 |
| Publishers | Springer-Verlag Berlin and Heidelberg Gm |
| Pages | 383 |
| Dimensions | 156 × 234 × 22 mm · 680 g |
| Language | German |
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