Positron Annihilation in Semiconductors: Defect Studies - Springer Series in Solid-State Sciences - Reinhard Krause-Rehberg - Books - Springer-Verlag Berlin and Heidelberg Gm - 9783642084034 - December 1, 2010
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Reinhard Krause-Rehberg
Positron Annihilation in Semiconductors: Defect Studies - Springer Series in Solid-State Sciences Softcover reprint of hardcover 1st ed. 1999 edition

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The subject of this book is the investigation of lattice imperfections in semiconductors by means of positron annihilation. The sensitivity range of positron annihilation with respect to the detection of these defects is compared to that of other defect-sensitive methods.

383 pages, 121 black & white illustrations, 20 black & white tables, biography

Media Books     Paperback Book   (Book with soft cover and glued back)
Released December 1, 2010
ISBN13 9783642084034
Publishers Springer-Verlag Berlin and Heidelberg Gm
Pages 383
Dimensions 232 × 156 × 47 mm   ·   626 g
Language English  

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