Microelectronic Test Structures for CMOS Technology - Manjul Bhushan - Books - Springer-Verlag New York Inc. - 9781441993762 - August 30, 2011
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Manjul Bhushan
Microelectronic Test Structures for CMOS Technology 2011 edition

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Microelectronic Test Structures for CMOS Technology and Products addresses the basic concepts of the design of test structures for incorporation within test-vehicles, scribe-lines, and CMOS products.

373 pages, 37 black & white tables, biography

Media Books     Hardcover Book   (Book with hard spine and cover)
Released August 30, 2011
ISBN13 9781441993762
Publishers Springer-Verlag New York Inc.
Pages 373
Dimensions 155 × 235 × 23 mm   ·   743 g
Language English  

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